Main characteristics and technical indicators
Maximum number of laser line inputs: 1000
Wavelength range: 1270 to 1650 nm (182 to 236 THz)
Absolute wavelength accuracy: ±0.2 ppm (±0.3 pm at 1550 nm and 1310 nm), laser line spacing ≥10 GHz
description
The new Keysight 86122B multi-wavelength meter is ideal for the efficient development, production, and verification of tunable laser transmitters and optical subsystems used in current and future high-speed applications.
The new 86122B multi-wavelength meter is an updated version of the proven 86122A. It has been redesigned to provide continuous support and manufacturability while being updated to fit the current computing environment. Care must be taken during tests conducted 24 hours a day, 7 days a week to minimize costly downtime. While maintaining backward compatibility with previous products, the new version also offers two USB ports that can be accessed from the front panel for connecting USB flash drives, mice or keyboards.
characteristic:
Wavelength scan time is less than 0.5 seconds
Wavelength accuracy: ± 0.3 pm
Large laser input power: +10dBm (+18dBm - safe input level)
Advanced built-in measurement application software (drift, OSNR, data logging, FP laser characterization)
Built-in HeNe laser wavelength standard
Advantage:
Fast wavelength scanning allows you to characterize the relationship between optical devices and wavelengths at twice the speed.
Excellent wavelength accuracy allows you to reliably and accurately characterize dense WDM systems to detect wavelength variations in channels and crosstalk between adjacent channels.
The transmitter can be tested without the need for additional connections and instruments such as attenuators.
The built-in application makes the new multi-wavelength meter an intelligent stand-alone test bench, reducing space requirements and costly test program development.
Built-in HeNe guarantees real-time, accurate absolute wavelength measurements based on standards at all times while ensuring accurate and repeatable results.
